Truth InstrumentsTruth Instruments (致真精密仪器)

AtomEdge Pro
Multi-functional Atomic Force Microscope

Sub-angstrom resolution AFM with AI-powered analysis. Engineered for nanoscale surface characterization, multi-modal imaging, and intelligent automation.

Vertical Resolution <0.1 nm
Noise Floor <50 fm/√Hz
Z Resolution 0.04 nm
Modes 7+
AtomEdge Pro full system with acoustic enclosure
Overview

The Researcher's Multi-Mode Workhorse

The AtomEdge Pro combines sub-angstrom resolution, a fully decoupled orthogonal scanner, and a dual-FPGA controller — covering 7+ imaging modes from topography to KPFM, MFM, PFM, and in-situ liquid-cell measurements without hardware changes.

Backed by 70 patents and deployed in 49+ Chinese research institutes. Engineered for researchers who need reliable, artifact-free quantitative data.

Orthogonal Decoupled Scanner

Three-axis capacitive closed-loop with 0.02% XY linearity. Artifact-free across the full 100 μm range.

SLD Laser Detection

<50 fm/√Hz noise floor. Resolves 0.39 nm SrTiO₃ atomic steps that laser-diode heads cannot.

Dual-FPGA @ 100 KHz

3-loop hardware feedback with 2 integrated lock-in amplifiers. 12 synchronized channels in one pass.

Technical Data

Specifications & Technology

Scan Range (XYZ)100 μm × 100 μm × 10 μm
Z Closed-loop Resolution0.04 nm
XY / Z Linearity0.02% / 0.08%
Vertical Resolution<0.1 nm (RMS < 40 pm)
Noise Floor<50 fm/√Hz (SLD)
Scan Rate0.1 – 30 Hz
Image Resolution32×32 – 4096×4096 px
Scanner Type3-axis orthogonal decoupled, capacitive closed-loop
StandardContact, Tapping, Phase, Lift, Multi-directional
ElectricalEFM, KPFM, PFM; Optional: C-AFM, SCM
MagneticMFM (two-pass lift)
In-situLiquid cell, light illumination, electrochemical, thermal
Laser SourceSuperluminescent Diode (SLD) S650.7.3, low coherence
CameraColor CMOS, 5 MP, real-time video
Field of View1680 × 1410 μm
Objective10× (optional 20×, 50×)
Optical Resolution1 μm
Motorized FocusYes, with auto-focus
ArchitectureDual high-speed FPGA
Converters≥8 DAC (XYZ 20-bit + 16-bit user + 20-bit bias), ≥10 ADC (4 ch > 50 MHz)
Feedback Loops3 independent, parallel
Lock-in Amplifiers2 integrated, > 1 MHz bandwidth, 0.1 Hz resolution
Data Channels12 simultaneous, time-synchronized
Feedback RateUp to 100 KHz
Sample StageUp to φ25 mm; motorized XY ±12.5 mm
Vibration IsolationMarble air table + acoustic enclosure (opt. active)
Tip ProtectionAutomated safe approach with force limit
Thermal Drift<1 nm/min (after 30-min warmup)
Glove-BoxYes (optional compact head)
EnvironmentLab, cleanroom, glove-box; optional enclosure
AI ModuleTruth-Seeker AI — literature search, experiment planning, auto analysis, report generation
Control SoftwareBilingual (EN/CN) GUI, real-time monitoring, 4-step workflow (Param → Approach → Scan → Retract)
Analysis SuiteRoughness, particle/pore, cross-section, PSD, 3D visualization, multi-format export

Orthogonal Decoupled Piezo Scanner

Three-axis orthogonal decoupled design with independent capacitive sensors per axis. Achieves 0.02% XY linearity and 0.08% Z linearity across the full 100 μm × 100 μm × 10 μm range. Reduces scanner bow to below 0.2 nm — one to two orders of magnitude better than tube scanners, which typically introduce 5–20 nm of background curvature.

For researchers, this means reliable step-height metrology, faithful thin-film roughness, and any measurement requiring accurate height data — without post-processing background subtraction.

Orthogonal decoupled piezo scanner close-up with grid comparison

Dual-FPGA Digital Controller

Hardware-level parallel processing for 3 independent feedback loops at up to 100 KHz — 3–10× faster than DSP-based systems. Two on-board lock-in amplifiers (>1 MHz bandwidth, 0.1 Hz resolution) provide zero-latency synchronous demodulation for EFM, KPFM, PFM, and other AC modes. No external lock-ins, no cabling delay.

Supports 12-channel time-synchronized data acquisition in a single scan pass — topography, phase, amplitude, lateral force, CPD, and up to 7 user-configurable auxiliaries.

Dual-FPGA digital controller architecture diagram

Superluminescent Diode (SLD) Laser

Broadband, low-coherence SLD source (coherence length <30 μm) virtually eliminates optical interference noise between the cantilever and nearby reflective surfaces. Drives the noise floor below 50 fm/√Hz and delivers vertical resolution better than 0.1 nm (RMS <40 pm) — less than half the diameter of a water molecule.

In practice: resolves 0.39 nm SrTiO₃ atomic steps, detects sub-monolayer film nucleation, and enables piconewton-level biological force spectroscopy that conventional laser-diode AFMs cannot achieve.

SLD noise spectrum, device photo, and 0.39 nm atomic step resolution

Integrated Automation & Glove-Box Ready

Fully automated 4-step workflow — Parameters → Approach → Scan → Retract — with one-click auto-find-peak, auto-approach, auto laser alignment, and PSD optimization. Reduces operator dependency and learning curve, delivering repeatable results across operators.

Compact head option integrates directly into glove-boxes and cleanrooms, with controller/computer outside the chamber via feedthrough. Essential for air-sensitive samples, inert-atmosphere studies, and multi-user research facilities.

Automated workflow — find-peak, approach, scan software interface
Why AtomEdge Pro

Six engineering choices that change what you can measure

Every subsystem is specified to push noise floor, precision, and throughput — the thresholds that skyrmion imaging, quantitative KPFM, and nano-mechanics actually demand.

<50 fm/√Hz

SLD Laser Displacement Sensor

Sub-angstrom noise floor enables reliable quantification of topological Hall signatures and sub-nanometer magnetic textures that laser-diode heads cannot resolve.

0.02%

Orthogonal Decoupled Flexure Scanner

XY linearity of 0.02% with capacitive closed-loop feedback removes scanner bow and axis cross-coupling — faithful quantitative mapping across the full 100 μm range.

0.04 nm

Picometer-Class Z Positioning

Closed-loop resolution holds the tip on a single lattice site through hours of scanning — the prerequisite for atomic-step imaging and repeatable force-curve arrays.

7+ modes

Complete Multi-Mode Suite

Contact / Tapping / KPFM / MFM / PFM / EFM / C-AFM / SCM — software-switchable on one platform. One workflow, one control loop, no probe-holder swaps.

In-situ

Liquid, Light, Electrical, Thermal

Engineered accessory line supports photocatalysis, electrochemistry, and variable-temperature studies — published in JCIS and Int. J. Hydrogen Energy.

49+

Institutes Served

Deployed across top Chinese universities and national labs including Peking Univ., Zhejiang Univ., Fudan, USTC, HIT, and CAS Institute of Physics. Referenced in peer-reviewed publications on magnetism, catalysis, and semiconductor materials.

AI & Automation

Truth-Seeker AI — your on-instrument research assistant

A self-developed AI model that turns the AFM from a data-acquisition device into an intelligent research platform. Truth-Seeker handles the tedious research-workflow tasks — so your time goes to science, not SOPs.

Literature Retrieval

Surfaces and summarizes the latest papers on your sample and measurement mode in seconds.

Experiment Design

Recommends scan parameters, probe type, and protocol from a natural-language description.

Standardized Guidance

Step-by-step operation that lowers the learning barrier and keeps results consistent.

Automated Reporting

Processes acquired data into structured reports with figures and publication-ready formatting.

Truth-Seeker AI 3D visualization output in the analysis software
"I want to review recent research on piezoelectric 2D materials and AFM — give me a brief summary."
Truth-Seeker · today 15:24

Over the past five years, PFM-based studies on 2D ferroelectrics have converged on three hotspots:

Polar skyrmion bubbles — CuInP₂Se₆, Nat. Commun. (2025) · DOI:10.1038/s41467-025-57714-9

Two-dimensional piezoelectric diodes — α-In₂Se₃, Nanoscale (2018)

Ultrathin HfO₂ ferroelectricity — Nature 580, 478 (2020)

"First-time AFM user — I want to image sample topography. What are the steps?"
Truth-Seeker

Recommended workflow: (1) probe install — tapping probe; (2) sample mount — magnetic puck; (3) laser alignment — use auto-align; (4) scan params — 5×5 μm, 256×256 px, 1 Hz; (5) run auto-approach; (6) begin scan.

Applications

Real Scan Data

Published gallery from Truth Instruments customers — materials science, magnetics, ferroelectrics, electrochemistry, and life sciences.

Grid reference sample — topography mode 25×25 μm
Topography

Grid Reference Sample · Tapping Mode · 25 × 25 μm

Periodic calibration standard imaged at 25 × 25 μm — demonstrates scanner linearity and closed-loop accuracy.

PbTiO₃–PMN ferroelectric domains — PFM mode 10×10 μm
PFM

PbTiO₃–PMN · PFM Mode · 10 × 10 μm

Ferroelectric domain switching and piezoresponse imaging on lead titanate–lead magnesium niobate ceramics.

BiVO₄ thin film — EFM mode 5×5 μm
EFM

Bismuth Vanadate · EFM Mode · 5 × 5 μm

Electrostatic force microscopy on photoactive BiVO₄ thin film — resolves local charge trap distribution.

BiVO₄ thin film — KPFM mode 5×5 μm
KPFM

Bismuth Vanadate · KPFM Mode · 5 × 5 μm

Kelvin probe force microscopy on the same BiVO₄ film — contact potential mapping of grain-to-grain variation.

Co/Fe/B magnetic thin film — MFM mode 25×25 μm
MFM

Co/Fe/B Thin Film · MFM Mode · 25 × 25 μm

Magnetic domain structure in Co/Fe/B multilayer — two-pass lift mode reveals domain walls and stripe patterns.

Co/Pt magnetic thin film — MFM mode 30×30 μm
MFM

Co/Pt Thin Film · MFM Mode · 30 × 30 μm

Perpendicular magnetic anisotropy domain structure in Co/Pt multilayer — foundation for skyrmion research.

Au-Ti strip electrode topography — tapping mode 18×18 μm
Topography

Au-Ti Strip Electrode · Tapping Mode · 18 × 18 μm

Surface topography of gold-titanium strip electrode — used in semiconductor and MEMS device characterization.

Al₂O₃ whisker — tapping mode 15×15 μm
Topography

Al₂O₃ Whisker · Tapping Mode · 15 × 15 μm

Single alumina whisker imaged against a flat substrate — demonstrates low-noise imaging of isolated nanowire features.

Performance Validation

Specifications you can cite. Research you can verify.

<0.1 nm
Vertical resolution
<50 fm/√Hz
SLD noise floor
100 KHz
Feedback rate
12 ch
Sync channels
Featured
Publications
Nat. Commun. · 2025 Tsinghua Univ. / HIT — Observation of switchable polar skyrmion bubbles in van der Waals CuInP₂Se₆ (PFM)
Nature · 2020 Fudan Univ. — Enhanced ferroelectricity in ultrathin HfO₂ films grown directly on silicon (PFM)
Nanoscale · 2018 Peking Univ. — Room-temperature ferroelectricity & switchable diode in α-In₂Se₃ thin layers
Appl. Phys. Lett. · 2026 Guangdong Univ. of Technology — Topological Hall effect in antiferromagnetic skyrmion systems (MFM)
Int. J. Hydrogen Energy Liaoning Univ. of Sci. & Tech. — Clean Energy & Fuel Chemistry Inst. — In-situ light-assisted KPFM on photocatalytic H₂ evolution
Software & Control

Intelligent AFM Software

AtomEdge Pro analysis software — 3D surface visualization interface
Real-time Control Software

Bilingual EN/CN GUI with live topography preview, auto-approach status, intelligent parameter optimization, and 4-step automated workflow (Parameters → Approach → Scan → Retract).

Comprehensive Analysis Suite

Built-in roughness (Ra/Rq/Rz), particle/pore analysis, cross-section profiling, power spectral density, and 3D visualization with publication-quality export.

Truth-Seeker AI

Proprietary AI for literature search, experiment planning, automated image analysis, and structured report generation — see the AI section above for details.

FAQ

Common Questions

The superluminescent diode (SLD) has a coherence length below 30 μm, eliminating optical interference noise that plagues conventional laser diodes. At <50 fm/√Hz, the AtomEdge Pro resolves 0.39 nm SrTiO₃ atomic steps that laser-diode systems cannot — making it one of the quietest commercial AFMs available.
Traditional tube scanners couple X-Y-Z motion, creating "bow" artifacts — curved lines where there should be straight ones. The AtomEdge Pro uses physically decoupled piezo axes with independent capacitive sensors, achieving 0.02% XY linearity and reducing scanner bow to <0.2 nm across the full 100 μm range. Raw data topology is faithful without post-processing correction.
Yes. Optional accessories include a liquid cell for biological imaging, light illumination for photoactive samples, an electrochemical cell, and a thermal stage. A compact AFM head is available for glove-box integration in inert-atmosphere or cleanroom environments.
Each scan pass captures height, deflection, amplitude, phase, lateral force, CPD, and up to 7 user-configurable auxiliary channels — all time-synchronized. This means you get topography, electrical, and magnetic data in a single scan without repeated passes or registration errors.
Truth-Seeker is a proprietary AI model integrated into the software. It assists with literature search and experiment planning before scanning, provides standardized workflow guidance during operation, and automates image analysis and report generation after data collection — reducing the learning curve for new users and accelerating the path from raw data to published results.

Manufactured by Truth Instruments (致真精密仪器) — a National "Little Giant" enterprise founded in 2019, headquartered in Qingdao with R&D centers in Beijing and Hangzhou. 51% of staff are dedicated to R&D; the company holds 70 patents and 31 software copyrights across its AFM product line. Their instruments are deployed at 49+ leading institutions including Tsinghua, Peking University, Fudan, Zhejiang University, USTC, HIT, CAS Institute of Physics, and Westlake University — as well as industry leaders like SMIC, Western Digital, Goertek, and BGI.

National "Little Giant" 70 Patents · 31 Software Copyrights 51% R&D Staff 49+ Institutes 5,500 m² Production Base
User Stories

From the Lab Bench to Publication

Guangdong University of Technology used AtomEdge Pro MFM to image zero-field skyrmions in [Pt/Co/Ru]₂ SAF systems — resolving ~150 nm domains that provided direct evidence for their Applied Physics Letters study on topological Hall effects.
Liaoning University of Science and Technology leveraged AtomEdge Pro's in-situ photo-assisted KPFM to map nanoscale interfacial charge dynamics in photocatalytic systems, supporting publications in Int. J. Hydrogen Energy and J. Colloid Interface Sci.
6–8 Week DeliveryStandard configuration lead time
On-site InstallationEngineer-assisted setup, calibration & training
48 h Tech SupportResponse within 2 business days
Research-Grade ValueSub-angstrom AFM without the premium price

Ready to Explore Sub-Angstrom Resolution?

Contact our applications team for pricing, lead times, and a live demo.