Microscopy & Metrology
High-resolution atomic force microscopy and surface metrology — from nanoscale imaging to sub-angstrom vertical resolution for materials science, semiconductors, and life sciences.
High-Resolution Imaging & Measurement
Our AFM platform covers the full spectrum from compact teaching instruments to fully automated wafer-scale metrology. Sub-angstrom vertical resolution, 7+ measurement modes, and an open architecture that adapts to materials science, semiconductor QC, and life science workflows.
Atomic Force Microscopy
Nanoscale surface imaging and measurement — from research-grade scanning to automated industrial metrology.
Surface Profilometry
Contact and non-contact surface profiling for step height, roughness, and 3D topography measurement.
Stylus Profilometer
Contact-mode surface profiling for step height and roughness measurement with nanometer vertical resolution.
Optical Profiler
Non-contact 3D surface metrology using white-light interferometry for high-speed areal topography.
Need help selecting the right microscopy or metrology system?
Our application specialists can recommend the ideal AFM configuration or surface metrology solution for your research and production requirements.