Microscopy & Metrology Systems
Atomic force microscopy, scanning and transmission electron microscopy, optical microscopy, and precision metrology — from sub-angstrom surface imaging to wafer-scale quality control.
Atomic Force Microscopy:
Seeing Surfaces at the Atomic Scale
Atomic Force Microscopy (AFM) is a scanning probe technique that images surfaces with sub-nanometer resolution by measuring the interaction force between a sharp tip and the sample. Unlike optical or electron microscopy, AFM requires no vacuum, no conductive coating, and no special sample preparation — it works on virtually any surface in ambient conditions.
Modern AFMs go far beyond topography imaging. Through specialized modes — Kelvin Probe Force Microscopy (KPFM), Magnetic Force Microscopy (MFM), Piezoresponse Force Microscopy (PFM), and Conductive AFM (C-AFM) — a single instrument can simultaneously map electrical potential, magnetic domains, piezoelectric response, and current flow at the nanoscale. This multi-modal capability makes AFM indispensable for semiconductor process development, thin-film characterization, battery electrode research, and biomaterials engineering.
Atomic Force Microscopy by Truth Instruments
As authorized distributors, we offer two cutting-edge AFM platforms from Truth Instruments — designed for research labs, universities, and semiconductor manufacturing.
Research
AtomEdge Pro
Multi-functional Atomic Force Microscope
Sub-angstrom resolution with AI-powered Truth-Seeker engine. Supports 7+ measurement modes including MFM, EFM, KPFM, PFM, and C-AFM for comprehensive nanoscale characterization.
Industrial
Atom Max
Wafer-level Atomic Force Microscope
8-inch wafer compatibility with ±100 mm motorized XY stage. Purpose-built for semiconductor wafer inspection, surface roughness measurement, and trench depth analysis.
AtomEdge Pro vs. Atom Max
Choose the right AFM platform for your application — research-grade flexibility or production-line throughput.
| Feature | AtomEdge Pro | Atom Max |
|---|---|---|
| Primary Use | Research & multi-modal analysis | Wafer-level QC & production metrology |
| Sample Type | Small samples (up to 40 mm) | 8-inch wafers (200 mm) |
| Z Noise Floor | <0.04 nm | 0.05 nm |
| Scan Range | 50 μm × 50 μm × 7 μm | 100 μm × 100 μm × 10 μm |
| XY Stage Travel | Manual or motorized (±25 mm) | ±100 mm (automated) |
| Feedback Bandwidth | Up to 100 KHz | Up to 100 KHz |
| Measurement Modes | 7+ (MFM, EFM, KPFM, PFM, C-AFM...) | 7+ (same modes, wafer-optimized) |
| Automation | Semi-automated (tip approach, laser align) | Fully automated (wafer recipe-based) |
| Cleanroom Compatible | Optional enclosure | Yes (ISO 5 / Class 100) |
| AI Analysis | Truth-Seeker AI built-in | Truth-Seeker AI built-in |
| Best For | Universities, national labs, R&D centers | Semiconductor fabs, QC departments |
Which AFM Platform is Right for You?
Choose based on your primary application, sample type, and throughput requirements. Both platforms share the same core technology — the difference is in scanning range, automation level, and target environment.
Choose AtomEdge Pro If...
- Your samples are smaller than 40 mm × 40 mm (chips, thin films, crystals)
- You need maximum measurement versatility — 7+ modes including MFM, PFM, KPFM, C-AFM
- Your research spans multiple disciplines (surface science, magnetics, ferroelectrics, bio)
- You want the lowest possible noise floor (<50 fm/√Hz) for atomic-resolution imaging
- You need glove-box or controlled-environment compatibility
Choose Atom Max If...
- You work with wafers up to 8 inches (200 mm) in diameter
- You need automated multi-point measurement across a large sample area
- Your primary application is semiconductor process control (roughness, CMP, trench depth)
- Cleanroom compatibility and enclosed operation are requirements
- You need recipe-based automated workflows for production environments
Not sure which platform fits your needs? Our application specialists can evaluate your sample types and measurement requirements to recommend the optimal configuration. Contact us for a free consultation.
Who Uses Our Microscopy Solutions
From academic research to semiconductor production — our instruments serve a wide range of institutions and industries.
Universities & Research Institutes
Materials science, physics, chemistry, and biology departments use AFM for fundamental research on surfaces, thin films, and nanostructures. The AtomEdge Pro's multi-modal capability enables interdisciplinary research from 2D materials characterization to biomolecular force spectroscopy.
University Solutions →Semiconductor Manufacturing
Wafer fabs rely on AFM for process control — measuring surface roughness, trench depth, film thickness uniformity, and defect inspection at production throughput. The Atom Max's automated workflow and cleanroom compatibility make it the instrument of choice for 200 mm wafer lines.
Industrial Solutions →National & Government Labs
Standards organizations and government research labs use AFM as a primary metrology tool for step-height calibration, surface texture standards, and traceable dimensional measurement. Both AtomEdge Pro and Atom Max support calibration-grade measurement workflows.
Lab Solutions →Energy & Battery Research
Lithium-ion battery and solar cell researchers use KPFM and C-AFM to map surface potential and current flow across electrode surfaces. AFM reveals grain boundary effects, SEI layer formation, and degradation mechanisms invisible to optical techniques.
Learn More →Advanced Microscopy Solutions
Scanning Electron Microscopy (SEM)
High-resolution SEM platforms with integrated EDS and EBSD capabilities for microstructural analysis, compositional mapping, and crystallographic studies. Essential for materials science, semiconductor QA, and failure root-cause investigation in industrial and research environments.
- Resolution down to 1-5 nm
- Magnification range: 10x to 100,000x
- Analytical tools: EDS mapping, EBSD analysis
Transmission Electron Microscopy (TEM)
Advanced TEM systems for atomic-scale imaging, nanostructure characterization, and crystal structure analysis. Includes STEM-EDS capabilities for precise chemical composition mapping at the nanometer scale, supporting research in materials science, nanotechnology, and biological imaging.
- Ultra-high resolution: <0.1 nm
- Operating voltage: 80-300 kV
- Analysis modes: EELS, electron tomography, STEM
Optical Microscopy Systems
Comprehensive optical microscopy platforms supporting bright-field, dark-field, fluorescence, and polarized light imaging. Ideal for biological samples, thin sections, quality inspection, and educational applications. Fully automated image capture and processing with advanced computational analysis tools.
- Magnification: 5x to 1000x
- Optical resolution: 200-500 nm (visible light)
- Imaging: Automated capture, real-time analysis, multi-channel fluorescence
Precision Measurement Tools
Surface Profilometers
Precision surface measurement systems for quantitative analysis of roughness, topography, step height, and coating thickness. Available in both contact and non-contact modes to suit different material types and surface conditions. Widely used in thin film validation, wafer inspection, and manufacturing quality control.
- Z-resolution: <1 nm (nanometer-level accuracy)
- Large scan area: up to 100mm x 100mm
- Measurement modes: stylus, optical, or laser-based
Atomic Force Microscopy (AFM)
High-precision AFM instruments for nanometer-scale surface imaging, topographic mapping, and mechanical property analysis. Advanced force spectroscopy capabilities enable study of surface adhesion, elasticity, and molecular-level interactions. Valuable for polymer research, nanotechnology development, and soft material characterization.
- XY resolution: 1 nm lateral accuracy
- Z-scan range: up to 15 μm vertical
- Force measurement sensitivity: <1 piconewton (pN)
Spectroscopy & Analysis Systems
Comprehensive spectroscopy platforms including XPS (X-ray Photoelectron Spectroscopy), XRF (X-ray Fluorescence), and Raman spectroscopy for chemical composition and oxidation state analysis. Critical for materials qualification, surface chemistry characterization, and contamination detection across research and industrial QC applications.
- Chemical detection limits: sub-ppm sensitivity
- Spatial resolution: ~100 nm (localized analysis)
- Multi-technique integration: XPS, XRF, Raman in one platform
Deployed at 100+ Research Institutions & Fabs
Truth Instruments AFM systems are trusted by top universities, national laboratories, and semiconductor manufacturers across China and internationally — from fundamental surface science research to production-line wafer metrology.
Truth Instruments:
Precision from China to the World
Founded in 2019 and headquartered in Qingdao, China, Truth Instruments (致真精密仪器) is a national high-tech enterprise and a recognized "Specialized & Innovative SME" (专精特新小巨人) — a designation awarded by the Chinese government to technology leaders in strategic industries.
With over 150 employees (51% in R&D), 70+ active patents, and a 5,500 m² production facility equipped with Class 100, Class 1,000, and Class 10,000 cleanrooms, Truth Instruments designs, manufactures, and tests every AFM system in-house. Their vertically integrated approach — from piezoelectric scanner fabrication to FPGA firmware development — ensures complete control over instrument quality and performance.
Truth Instruments' mission is to make world-class nanoscale characterization accessible. Their proprietary Truth-Seeker AI engine, integrated dual-FPGA controller architecture, and fully automated measurement workflows represent a new paradigm in AFM instrumentation — combining research-grade performance with production-line simplicity.
Comprehensive After-Sales Support
Backed by Foresee's 15 years of scientific instrument distribution experience and Truth Instruments' factory-direct engineering team.
7×24 Rapid Response
Dedicated hotline with 2-hour engineer assignment. Online and on-site dual-channel support to diagnose and resolve issues fast.
Guaranteed Resolution Times
Minor faults: 24 hours. Moderate issues: 48 hours. Complex problems: 72 hours with a dedicated task force and documented action plan.
Loaner Instrument Program
If your AFM requires extended repair, we provide a functionally equivalent loaner unit — ensuring your research never stops.
Tiered Training System
On-site commissioning training at delivery, plus regular online and offline advanced courses. Custom industry-specific training available.
Free Software Upgrades
OTA software updates at no cost. Hardware upgrades with custom solutions, on-site installation, and post-upgrade performance certification.
OEM Parts Guarantee
All maintenance and upgrades use genuine factory parts and authorized procedures — ensuring your instrument performs like new.
Need imaging or metrology solutions?
Our team will help select the right system for your research or quality control applications with expert consultation.